About View Micro-Metrology
VIEW Micro-Metrology is the combination of VIEW Engineering and Micro-Metric, two pioneers in high precision video measurement systems – each with over 30 years of proven performance. VIEW Engineering introduced the world’s first video coordinate measuring machine – the VIEW RB-1 – in 1976, and has continued to lead the industry with innovations in optics, lighting and imaging software ever since.
Micro-Metric was founded in 1979 and has produced some of the world’s most precise optical metrology systems for wafer, slider, flat-panel display and electronic assembly applications. The combined expertise of VIEW Engineering and Micro-Metric enables leading technology companies in micro-manufacturing, data storage, semiconductor, solar cell, and MEMs to develop and control critical manufacturing processes and product quality.
In 2005, Micro-Metric merged with VIEW Engineering to form the Micro-Metrology Group of Quality Vision International, Inc., the world’s largest vision metrology company. This merger benefits all of View customers through access to a worldwide network of engineering, manufacturing and software resources and strengthens the QVI commitment to process metrology.
View Systems
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The Pinnacle 250
The Pinnacle 250 offers the highest accuracy and fastest speeds of the VIEW Micro-Metrology line. Its high performance and compact footprint make it VIEW Micro-Metrology’s most popular model.The Pinnacle features a damped granite base and column, with passive vibration isolation. A precision compound X-Y stage with high-speed linear motor drives provides velocity of 400 mm / sec and acceleration of 1000 mm / sec2. This combination of high acceleration and high velocity enables the high throughput required for near-line process monitoring.
The rugged, compact design of the Pinnacle lends itself to installation in either a Q/A lab or at an inspection station in the manufacturing line. The Pinnacle is ideal for measurement of small, close tolerance parts, particularly parts with a high density of features, such as hard disk drive suspensions, printer heads, precision stampings, leadframes, ball-grid arrays, and chip scale packages.
The Pinnacle can be equipped with an optional through-the-lens or offset mounted laser for added flexibility in Z-axis measurements. Pinnacle models can also utilize the optional SpectraProbe™ offering sub-micron Z-axis measurement resolution.
The system operates with one or more of VIEW Micro-Metrology’s standard metrology software packages:
- VIEW Metrology Software (VMS™) which offers a wide array of standard measurement tools as well as a built-in scripting language to enable custom-functions.
- Elements® CAD-to-Measure software provides automatic translation of 2-D CAD files in measurement programs, enabling very fast set-up of measurement routines for even the most complex parts.
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Benchmark 250
The Benchmark 250 is a compact general-purpose metrology system with all the features and capabilities of the larger VIEW Micro-Metrology models. With travel of 300 x 150 x 150 mm, the Benchmark can accommodate a wide range of part sizes, and is rugged enough to be located in either a Q/A lab or an inspection station on the production floor.The Benchmark 250 includes a precision compound X-Y stage, and VIEW Micro-Metrology’s exclusive dual magnification optics. An optional laser sensor adds unparalleled Z-axis measurement capability to this compact system.
The Benchmark 250 is well suited to measure many types of components, including molded plastic parts, machined parts, electronic assemblies, semiconductor packages, fiber optic components, disk media substrates, recording head die, or semiconductor wafers up to 150 mm in diameter.
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Benchmark 450
The Benchmark 450 combines mid-range travel, high accuracy and a rugged, compact design in one value package that is ideally suited for the production floor. The Benchmark’s fixed bridge design separates the X and Y axis motions, allowing each to operate without any influence on the other. This arrangement provides the maximum mechanical integrity and accuracy in stage motion. The bridge type design also makes loading and unloading of large parts more efficient, and helps to minimize the overall footprint of the system.The Benchmark 450 is extremely compact, with a total footprint of less than 20 square feet. Dual magnification optics and an optional through-the-lens (TTL) laser sensor make it an ideal system for many applications including molded plastic parts, screen printer stencils, printed circuit boards, solder paste, epoxy glue dots, precision machined parts, and many others.
The Benchmark 450 operates with any of VIEW Micro-Metrology’s standard metrology software packages:
- VIEW Metrology Software (VMS™)
- Elements® Electronic Measurements Software
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The Summit 450/600/800
The Summit 450/600/800 systems provide high accuracy in a large measurement envelope. Summit systems feature a granite base and fixed bridge – a well-proven design for high accuracy, larger travel measurement systems.Summit 450 and 600 models are offered with a choice of either high-speed servo motor drives or linear motor drives. The Summit 800 uses a precision ball-screw and servo motor drive system.
All Summit models offer very high accuracy, while the linear motor models offer high speeds and improved motion control for accuracy and throughput. The Summit systems are ideal for measurement of large format parts requiring high accuracy, such as solder paste stencils and screens, artwork, panelized printed circuit boards, flex circuits, and micro-etched parts.
Summit models can be equipped with an optional through-the-lens or offset mounted laser for added flexibility in Z-axis measurements. Summit models can also utilize the optional SpectraProbe™ offering sub-micron Z-axis measurement resolution.
Summit models operate with one or more of VIEW Micro-Metrology’s standard metrology software packages:
- VIEW Metrology Software (VMS™)
- Elements® Electronic Measurements Software
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The Precis® 200
The Precis® 200 incorporates the most advanced design and technology from VIEW-MM. Based on the proven Innova wafer metrology system from Micro-Metric, the Precis includes a number of configurable options that make the system more versatile, serviceable and reliable:- Extended Z-axis range – 2.5mm, 5mm or 100mm Transmitted illumination Integral electronics drawer – fully compliant with SEMI S2 and CE standards
- Ergonomic operator control station with hide-away keyboard tray, adjustable height and angle for control panel and display monitor, SEMI S8 compliant Fully automated microscope with all settings computer controlled
- Megapixel camera for optimum resolution VIEW Metrology Software (VMS™) allows a wide range of components to be measured, with the option of CAD translation and full geometric dimensioning and tolerancing.
- MMWin – wafer and mask metrology software – ideal for critical dimension and overlay registration measurement for wafers, slider ABS, photomask and flat panel displays.
View Systems Key Technologies
VIEW Micro-Metrology systems achieve their high accuracy, reliability, and throughput from nine core technologies:
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Transport Design
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Optics
All VIEW Micro-Metrology systems use our exclusive Dual Magnification Optics System to provide accurate images under a wide variety of lighting conditions. -
Illumination
All VIEW Micro-Metrology systems are equipped with high brightness LED illuminators. Back-light and through-the-lens surface light are standard on all machines. During programming and automatic measurements, the light source and intensity for each measurement may be programmed to best illuminate the feature of interest. -
Ronchi Grid
VIEW Micro-Metrology’s Ronchi (projected grid) autofocus system is designed for situations where there is little or no surface texture visible to the camera, making traditional autofocus difficult. The system projects a grid of lines onto the part surface and then measures the sharpness of the grid image. -
Integrated Laser Options
Through-the-Lens (TTL) Laser Integrated Laser Option
VIEW Micro-Metrology systems support a variety of laser sensors that are implemented either through-the-lens (TTL) or mounted at an offset to the video camera. The primary factors dictating the use of a given laser sensor include the sensor’s measurement range, resolution, spot diameter, working distance, and ability to work with specular or diffuse surfaces.
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Digital Megapixel Camera
Available digital megapixel cameras offer significant advantages for precision metrology. The larger pixel array provides a larger field of view, while greater pixel density provides higher resolution. A larger field of view can improve throughput by capturing more part information with less stage motion. High pixel density improves accuracy and repeatability at a given magnification.
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Area Multi-Focus (AMF)
3D Surface Measurement AMF™ is an advanced video analysis technique that uses the data collected from a normal video auto-focus step and turns it into a 3D image of a feature. In addition to 3D information, it provides height or depth measurement of multiple features of a single image.Learn MoreLearn More
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Blaze
Metrology bottlenecks slowing you down?Keep moving with VIEW Micro-Metrology’s Blaze technology —Broadband for video measurement. If process metrology has you waiting for data, check out the latest high speed metrology systems from VIEW Micro-Metrology.
Increase your measurement bandwidth with Blaze.
View System Software
Metrology systems vary significantly in their utility, which is largely a function of software. The software ultimately determines what the system can do, and if certain capabilities, commands, or calculations are absent, it can severely compromise productivity.
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Metrology Software
Automated Solutions for Process Monitoring and Control Requirements
VIEW Metrology Software (VMS) presents feature-oriented programming in a standard Windows® interface, effectively bridging the gap between the Q/A lab and the production environment.
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Elements
CAD-to-Measure Software for Electronic Assemblies & PackagesVIEW Micro-Metrology’s Elements software is designed specifically for precision measurement of circuit board and electronic assemblies in a high mix manufacturing environment. Elements uses a library of pre-configured SMT component algorithms to automatically create measurement routines from CAD Files. No time-consuming programming is required – simply import the CAD file and the routine is ready for measurement. Elements allows part changeovers to be set up in minutes, not hours.
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QC-CALC
QC-CALC® is a fully automatic Statistical Process Control (SPC) program that collects, analyzes, and reports inspection data from your VIEW Micro-Metrology measurement system. The automatic database creation, collection, and display has been fine tuned for Window’s DDE, RS232, or a simple file transfer system. -
Metrology Software
Automated Solutions for Process Monitoring and Control RequirementsVIEW Metrology Software (VMS) presents feature-oriented programming in a standard Windows® interface, effectively bridging the gap between the Q/A lab and the production environment.
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VIP
VIEW Interface Program (VIP) SoftwareVIEW Micro-Metrology’s VIP interface program works with VMS to allow creation of customized access screens for the production floor operator. With VIP, the user sees only the essential functions needed to select the part routine, run it, and collect the part data.