Motorized Head Systems
Motorized indexing heads are designed to position the probe at one of 720 positions, so probing can be carried out at many angles. The repeatability of the head recalls positions without the need for re-qualification, saving operator time and applying the probe to the surface at the best angle for the most accurate result.
Motorized servo type heads provide almost unlimited angular positioning and are ideally suited to horizontal arm CMMs.
PH10 PLUS motorized indexing heads
PH10 PLUS motorized probe heads increase throughput by giving automated CMMs the added capability of program controlled probe re-orientation. This enables the inspection of features at different angles without the need for frequent, time consuming stylus cluster changes.
The range comprises three PH10 PLUS models, each of which can carry a range of probes and extensions and can be orientated in 720 repeatable positions, giving access to the most difficult-to-reach workpiece features.
All three variants of the new PH10 PLUS heads are now supplied with a revised repeatability specification, down from 0.5 µm (2σ) to just 0.4 µm (2σ) (specified at a distance of 100 mm), giving users improved positioning at the stylus tip. The new specification heads are physically differentiated by a new ‘aqua blast’ finish which gives a modern, matt black appearance.
The PH10M PLUS can carry long extension bars and complex probes such as SP25M or TP7M. The highly repeatable autojoint allows rapid probe or extension bar changing without the need for re-qualification.
The PH10MQ PLUS is a variant of the PH10M PLUS that allows the motorized head to be attached directly to the quill with the B-axis of the head inside the quill itself. This option provides a neater and shorter probe mount, with only the A-axis protruding from the quill.
PH10 PLUS motorized probe heads
The range of PH10 PLUS motorized probe heads increases throughput by giving automated CMMs the added capability of program controlled probe re-orientation. This enables the inspection of features at different angles without the need for frequent, time consuming stylus cluster changes.
Less time calibrating, more time measuring!
The inferred qualification allows PH10M‑iQ PLUS to access multiple positions without having to recalibrate for each one.
- PH10M‑iQ PLUS is supplied with a calibration file that is created during manufacture
- This calibration file is then applied by the probe routine on the CMM *
- Following a quick initial calibration procedure, PH10M‑iQ PLUS allows the user to operate the head / probe combination in every orientation possible without recalibration
- PH10M‑iQ PLUS increases throughput by reducing calibration overhead
- Scanning probes can only be used in traditional PH10 mode with PH10M‑iQ PLUS; touch-trigger probes can use the inferred qualification method
* Must be supported by application software
PHS1 Servo Head
The PHS1 servo positioning head features continuous servo drive in two axes, enabling the probe configuration to be positioned at almost any angle. The PHS1 head is not locked into position in the same way as a PH10 indexing head. Instead it is driven to approximately the required position and, when a probing point is taken, the axes of the head latch simultaneously with the axes of the CMM to give accurate measurements.
The PHS1 head is controlled directly from an interface card in the CMM controller. Full information is given in the PHS1 programmers’ guide.
A range of different probes can be fitted and automatically exchanged. These include touch-trigger probes, contact scanning probes and optical measurement probes.
Extra long extensions allow the Renishaw trigger probes to reach normally inaccessible features.
The head is protected by a built-in overtravel protection unit which signals the machine to stop in the event of a collision.
RTP20 Automated Probe Head
RTP20 offers low-cost ‘motorized’ head functionality with integral TP20 touch-trigger probe, providing improved productivity, increased reach and flexibility.
The automated indexing of the RTP20 allows the integral TP20 probe to be moved to 168 repeatable positions in 15-degree increments using both the A and B axes, requiring a one-time only qualification for each stylus position thus ensuring fast throughput for part inspection.